Electron microscopy is a technique that uses a beam of:
a) X-rays
b) Electrons
c) Protons
d) Neutrons
Answer: b) Electrons
Which of the following is NOT a type of electron microscope?
a) Transmission electron microscope (TEM)
b) Scanning electron microscope (SEM)
c) Atomic force microscope (AFM)
d) Scanning tunneling microscope (STM)
Answer: c) Atomic force microscope (AFM)
In electron microscopy, the specimen is illuminated with a beam of electrons, and the resulting image is formed by:
a) Reflection of electrons
b) Absorption of electrons
c) Scattering of electrons
d) Refraction of electrons
Answer: c) Scattering of electrons
Which type of electron microscope is used to study the internal structure of a specimen?
a) Transmission electron microscope (TEM)
b) Scanning electron microscope (SEM)
c) Scanning tunneling microscope (STM)
d) Atomic force microscope (AFM)
Answer: a) Transmission electron microscope (TEM)
Which type of electron microscope is used to study the surface morphology of a specimen?
a) Transmission electron microscope (TEM)
b) Scanning electron microscope (SEM)
c) Scanning tunneling microscope (STM)
d) Atomic force microscope (AFM)
Answer: b) Scanning electron microscope (SEM)
In electron microscopy, the wavelength of the electron beam is much _________ than the wavelength of visible light.
a) Longer
b) Shorter
c) Equal
d) Unrelated
Answer: b) Shorter
The maximum achievable magnification in electron microscopy is _______ compared to light microscopy.
a) Lower
b) Higher
c) Equal
d) Unrelated
Answer: b) Higher
The resolving power of an electron microscope is ________ compared to light microscopy.
a) Lower
b) Higher
c) Equal
d) Unrelated
Answer: b) Higher
The sample preparation for electron microscopy typically involves:
a) Staining with dyes
b) Embedding in resin
c) Sectioning with a microtome
d) All of the above
Answer: d) All of the above
The image formation in a transmission electron microscope is based on:
a) Absorption of electrons by the specimen
b) Reflection of electrons by the specimen
c) Scattering of electrons by the specimen
d) Refraction of electrons by the specimen
Answer: a) Absorption of electrons by the specimen
In a scanning electron microscope, the electron beam scans across the surface of the specimen and collects:
a) Reflected electrons
b) Absorbed electrons
c) Scattered electrons
d) Transmitted electrons
Answer: a) Reflected electrons
In electron microscopy, the magnification is controlled by:
a) The voltage of the electron beam
b) The focal length of the objective lens
c) The strength of the electromagnetic lenses
d) The size of the specimen
Answer: c) The strength of the electromagnetic lenses
The depth of field in electron microscopy is _______ compared to light microscopy.
a) Lower
b) Higher
c) Equal
d) Unrelated
Answer: a) Lower
Which of the following is NOT a limitation of electron microscopy?
a) Limited specimen size
b) Vacuum requirement
c) High cost
d) Limited resolution
Answer: d) Limited resolution
Which component of an electron microscope is responsible for focusing the electron beam onto the specimen?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: b) Objective lens
Which of the following techniques can provide elemental analysis using electron microscopy?
a) Energy-dispersive X-ray spectroscopy (EDS)
b) Scanning tunneling microscopy (STM)
c) X-ray diffraction (XRD)
d) Fluorescence microscopy
Answer: a) Energy-dispersive X-ray spectroscopy (EDS)
In electron microscopy, the specimen is typically coated with a thin layer of a conductive material to:
a) Enhance contrast
b) Protect the specimen from electron beam damage
c) Reduce charging effects
d) All of the above
Answer: d) All of the above
In a scanning electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: a) Secondary electrons
Which of the following is a limitation of transmission electron microscopy?
a) Limited penetration depth of electrons
b) Sample must be thin and electron-transparent
c) Specimen preparation is more complex
d) All of the above
Answer: d) All of the above
Which component of an electron microscope is responsible for controlling the intensity of the electron beam?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: c) Aperture diaphragm
Which of the following is a technique used in electron microscopy to enhance contrast in the image?
a) Staining with heavy metals
b) Phase contrast microscopy
c) Dark-field microscopy
d) Fluorescence microscopy
Answer: a) Staining with heavy metals
In electron microscopy, the resolution is limited by:
a) The wavelength of the electron beam
b) The numerical aperture of the objective lens
c) The size of the specimen
d) The strength of the electromagnetic lenses
Answer: a) The wavelength of the electron beam
Which type of electron microscope can provide three-dimensional images of a specimen?
a) Transmission electron microscope (TEM)
b) Scanning electron microscope (SEM)
c) Scanning tunneling microscope (STM)
d) Atomic force microscope (AFM)
Answer: d) Atomic force microscope (AFM)
In a scanning electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: b) Backscattered electrons
Which component of an electron microscope is responsible for controlling the focus of the electron beam?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: b) Objective lens
Which of the following is a technique used in electron microscopy to study the crystal structure of a specimen?
a) Electron diffraction
b) Energy-dispersive X-ray spectroscopy (EDS)
c) Scanning tunneling microscopy (STM)
d) Fluorescence microscopy
Answer: a) Electron diffraction
In electron microscopy, the contrast in the image is determined by:
a) The electron beam energy
b) The interaction of electrons with the specimen
c) The type of detector used
d) The numerical aperture of the objective lens
Answer: b) The interaction of electrons with the specimen
Which of the following is a technique used in electron microscopy to study the magnetic properties of a specimen?
a) Electron energy loss spectroscopy (EELS)
b) Scanning tunneling microscopy (STM)
c) Magnetic force microscopy (MFM)
d) Fluorescence microscopy
Answer: c) Magnetic force microscopy (MFM)
In electron microscopy, the depth of field refers to:
a) The thickness of the specimen
b) The depth of focus of the electron beam
c) The distance between the objective lens and the specimen
d) The distance between the electron source and the specimen
Answer: b) The depth of focus of the electron beam
Which of the following is a technique used in electron microscopy to study the electronic properties of a specimen?
a) Electron energy loss spectroscopy (EELS)
b) Scanning tunneling microscopy (STM)
c) Atomic force microscopy (AFM)
d) Fluorescence microscopy
Answer: a) Electron energy loss spectroscopy (EELS)
In electron microscopy, the spatial resolution is determined by:
a) The numerical aperture of the objective lens
b) The size of the electron beam
c) The wavelength of the electron beam
d) The magnification of the image
Answer: c) The wavelength of the electron beam
Which type of electron microscope can provide real-time images of a specimen in liquid?
a) Transmission electron microscope (TEM)
b) Scanning electron microscope (SEM)
c) Scanning tunneling microscope (STM)
d) Environmental scanning electron microscope (ESEM)
Answer: d) Environmental scanning electron microscope (ESEM)
Which of the following is a technique used in electron microscopy to study the chemical composition of a specimen?
a) Energy-dispersive X-ray spectroscopy (EDS)
b) Scanning tunneling microscopy (STM)
c) X-ray diffraction (XRD)
d) Fluorescence microscopy
Answer: a) Energy-dispersive X-ray spectroscopy (EDS)
In electron microscopy, the specimen must be:
a) Transparent to electrons
b) Opaque to electrons
c) Conductive to electrons
d) Non-conductive to electrons
Answer: c) Conductive to electrons
Which component of an electron microscope is responsible for shaping the electron beam?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: a) Condenser lens
In electron microscopy, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: a) Secondary electrons
Which of the following is a technique used in electron microscopy to study the topography of a specimen?
a) Scanning tunneling microscopy (STM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: b) Atomic force microscopy (AFM)
In a transmission electron microscope, the electron beam passes through the specimen and is collected by a:
a) Scintillator
b) Photomultiplier tube
c) CCD camera
d) Electron detector
Answer: d) Electron detector
Which of the following is a technique used in electron microscopy to study the mechanical properties of a specimen?
a) Scanning tunneling microscopy (STM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: b) Atomic force microscopy (AFM)
In a scanning electron microscope, the electron beam is typically generated by:
a) A heated filament
b) A field emission source
c) A thermionic emission source
d) A laser diode
Answer: c) A thermionic emission source
Which of the following is a technique used in electron microscopy to study the composition and structure of a specimen?
a) Electron energy loss spectroscopy (EELS)
b) Electron diffraction
c) X-ray diffraction (XRD)
d) All of the above
Answer: d) All of the above
In electron microscopy, the electron beam is focused and shaped using:
a) Magnetic lenses
b) Electrostatic lenses
c) Both magnetic and electrostatic lenses
d) Mechanical apertures
Answer: c) Both magnetic and electrostatic lenses
Which of the following is a technique used in electron microscopy to study the chemical bonding within a specimen?
a) Electron energy loss spectroscopy (EELS)
b) Scanning tunneling microscopy (STM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Electron energy loss spectroscopy (EELS)
In electron microscopy, the contrast in the image can be enhanced by:
a) Adjusting the electron beam energy
b) Tilting the specimen
c) Using different detectors
d) All of the above
Answer: d) All of the above
Which of the following is a technique used in electron microscopy to study the magnetic domains within a specimen?
a) Magnetic force microscopy (MFM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Magnetic force microscopy (MFM)
In electron microscopy, the resolution is determined by the:
a) Numerical aperture of the objective lens
b) Size of the electron beam
c) Wavelength of the electron beam
d) Magnification of the image
Answer: c) Wavelength of the electron beam
Which of the following is a technique used in electron microscopy to study the surface properties of a specimen?
a) Scanning tunneling microscopy (STM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: b) Atomic force microscopy (AFM)
In a scanning electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: a) Secondary electrons
Which component of an electron microscope is responsible for generating the electron beam?
a) Condenser lens
b) Objective lens
c) Electron gun
d) Illuminator
Answer: c) Electron gun
Which of the following is a technique used in electron microscopy to study the growth and composition of thin films?
a) Reflection electron microscopy (REM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Reflection electron microscopy (REM)
In electron microscopy, the specimen is typically mounted on a:
a) Glass slide
b) Copper grid
c) Metal stub
d) Quartz substrate
Answer: c) Metal stub
Which of the following is a technique used in electron microscopy to study the surface charge distribution of a specimen?
a) Kelvin probe force microscopy (KPFM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Kelvin probe force microscopy (KPFM)
In a transmission electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: c) Transmitted electrons
Which of the following is a technique used in electron microscopy to study the defects and dislocations within a specimen?
a) Electron diffraction
b) Electron backscatter diffraction (EBSD)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: b) Electron backscatter diffraction (EBSD)
In a scanning electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: b) Backscattered electrons
Which component of an electron microscope is responsible for controlling the brightness of the electron beam?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: d) Illuminator
In electron microscopy, the image contrast can be enhanced by:
a) Adjusting the beam current
b) Using different imaging modes
c) Controlling the specimen thickness
d) All of the above
Answer: d) All of the above
Which of the following is a technique used in electron microscopy to study the surface roughness of a specimen?
a) Atomic force microscopy (AFM)
b) Scanning tunneling microscopy (STM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Atomic force microscopy (AFM)
In electron microscopy, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: a) Secondary electrons
Which of the following is a technique used in electron microscopy to study the composition and distribution of elements within a specimen?
a) Energy-dispersive X-ray spectroscopy (EDS)
b) Scanning tunneling microscopy (STM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Energy-dispersive X-ray spectroscopy (EDS)
In electron microscopy, the beam current refers to the:
a) Number of electrons in the beam
b) Energy of the electrons in the beam
c) Intensity of the electrons in the beam
d) Magnification of the beam
Answer: c) Intensity of the electrons in the beam
Which of the following is a technique used in electron microscopy to study the crystal orientation of a specimen?
a) Electron diffraction
b) Energy-dispersive X-ray spectroscopy (EDS)
c) Scanning tunneling microscopy (STM)
d) Fluorescence microscopy
Answer: a) Electron diffraction
In electron microscopy, the beam energy refers to the:
a) Number of electrons in the beam
b) Wavelength of the electrons in the beam
c) Voltage of the electrons in the beam
d) Magnification of the beam
Answer: c) Voltage of the electrons in the beam
Which of the following is a technique used in electron microscopy to study the strain and lattice defects within a specimen?
a) Electron diffraction
b) High-resolution transmission electron microscopy (HRTEM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: b) High-resolution transmission electron microscopy (HRTEM)
In a scanning electron microscope, the image is formed by detecting:
a) Secondary electrons
b) Backscattered electrons
c) Transmitted electrons
d) Absorbed electrons
Answer: a) Secondary electrons
Which component of an electron microscope is responsible for controlling the depth of focus?
a) Condenser lens
b) Objective lens
c) Aperture diaphragm
d) Illuminator
Answer: b) Objective lens
In electron microscopy, the image contrast can be influenced by:
a) The electron beam energy
b) The specimen thickness
c) The detector used
d) All of the above
Answer: d) All of the above
Which of the following is a technique used in electron microscopy to study the chemical state of elements within a specimen?
a) X-ray photoelectron spectroscopy (XPS)
b) Scanning tunneling microscopy (STM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) X-ray photoelectron spectroscopy (XPS)
In electron microscopy, the beam diameter refers to the:
a) Number of electrons in the beam
b) Size of the electrons in the beam
c) Voltage of the electrons in the beam
d) Magnification of the beam
Answer: b) Size of the electrons in the beam
Which of the following is a technique used in electron microscopy to study the surface charge distribution of a specimen?
a) Kelvin probe force microscopy (KPFM)
b) Atomic force microscopy (AFM)
c) Fluorescence microscopy
d) Phase contrast microscopy
Answer: a) Kelvin probe force microscopy (KPFM)
